2005.09－2010.08 美国中佛罗里达大学，微电子器件，博士学位 2001.09－2003.06 华中科技大学，微电子科学与技术，硕士学位 1997.09－2001.06 华中科技大学，电子工程，学士学位

2011-现在，电子科技大学微电子与固体电子学院，副教授 2010-2011，北京大学深圳SOC重点实验室，芯片ESD相关研究。 2003.07-2004.12，美国模拟器件公司(ADI)北京设计中心，任芯片设计工程师

1. Fan Liu, Zhiwei Liu, Jizhi Liu, Hui Cheng, Liu Zhao, Rui Tian, Shiyu Song and Juin J. Liou, “A novel vertical SCR for ESD protection in 40V HV bipolar process”, Microelectronics Reliability, Vol.78, pp. 307-310, Nov. 2017 2. Yu Liu, Wen Huang, Tianxun Gong, Yue Su, Hua Zhang, Yiwen He, Zhiwei Liu and Bin Yu, “Ultra-sensitive near-infrared graphene photodetctors with nanopillar antennas”, Nanoscale, 2017, 9, 17459-17464 3. Bo Liu, Chia-Ming Yang, Zhiwei Liu and Chao-Sung Lai, “N-doped graphene with low intrinsic defect densities via a solid source dopoing technique”, Nanomaterials 2017, 7, 302 4. Xiaozong Huang, Zhiwei Liu, Fan Liu, Jizhi Liu and Wenqiang Song, “High holding voltage SCRs with segmented layout for high-robust ESD protection”, Electronics Letters, Vol. 53, pp. 1274-1275, No. 18, Aug. 2017 5. Liu Jizhi, Zeng Yaohui, Liu Zhiwei, Zhao Jianming, Cheng Hui and Liu Nie, “Low voltage triggering SCRs for ESD protection in a 0.35um SiGe BiCMOS process”, Microelectronics Reliability, Vol.73, pp. 122-128, June 2017 6. Liu Jizhi, Qian Lingli, Tian Rui, Liu Zhiwei, Zhao Liu and Cheng Hui, “Self-triggered stacked silicon-controlled rectifier structure (STSSCR) for on-chip electrostatic discharge (ESD) protection”, Microelectronics Reliability, Vol. 71, pp. 1-5, April 2017 7. Changjun Liao, Jizhi Liu and Zhiwei Liu, “New fast turn-on speed SCR device for electrostatic discharge protection”, Microelectronics Reliability, Vol. 66, pp. 38-45, Nov. 2016 8. Xiaozong Huang, Juin J. Liou, Zhiwei Liu, Fan Liu, Jizhi Liu and Hui Cheng, “A new high holding voltage dual-direction SCR with optimized segmented topology”, IEEE Electron Device Letters, Vol. 37, No. 10, pp 1311-1313, Oct. 2016 9. Yue Su, Zhongxun Guo, Wen Huang, Zhiwei Liu, Tianxun gong, Yiwen He and Bin Yu, “Ultra-sensitive graphene photodetector with plasmonic structure”, Applied Physics Letters, 109, 173107, 2016 10. Xiang Li,Wen Huang, Guang Yao, Min Gao, Xiongbang Wei, Zhiwei Liu, Hua Zhang, Tianxun Gong and Bin Yu “Highly sensitive flexible tactile sensors based on microstructured multiwall carbon nanotube arrays”, Scripta Materialia, Vol. 129, pp. 61-64, Sept. 2016 11. Linfeng He, Te-Kuang Chiang, Juin J. Liou, Wechao Zheng and Zhiwei Liu, “A new analytical subthreshold potential/current model for quadruple-gate junctionless MOSFET”, IEEE Transactions on Electron Devices, Vol. 61, No. 6, pp. 1972-1978, June 2014 12. Ze Jia, Gong Zhang, Jizhi Liu, Zhiwei Liu and Juin J. Liou, “Reference voltage generation scheme enhancing speed and reliability for 1T1C-type FRAM ”, Electronics Letter, Vol. 50, No. 3, pp.154-156, 2014 13. Shurong Dong, Meng Miao, Jian Wu, Jie Zeng, Zhiwei Liu and Juin J. Liou, “Low-capacitance SCR structure for RF I/O application”, IEEE Transactions on Electromagnetic Compatibility, Vol. 55, No. 2, pp. 241-247, April 2013 14. Zhiwei Liu, Juin J. Liou, Shurong Dong and Yan Han, “Silicon controlled rectifier stacking structure for high-voltage ESD protection applications”, IEEE Electron Device Letters, Vol. 31, No.8, pp.845-847, Aug. 2010 15. Zhiwei Liu, Juin J. Liou and Jim Vision, “Novel silicon-controlled rectifier (SCR) for high-voltage Electrostatic Discharge (ESD) applications”, IEEE Electron Device Letters, Vol. 29, No. 7, pp.753-755, July 2008 16. Zhiwei Liu, Jim Vison, Lifang Lou, Juin J. Liou, “An improved bidirectional SCR structure for low-triggering ESD protection applications”, IEEE Electron Device Letters, Vol. 29, No. 4, pp. 360-362, April 2008 17. Javier A. Salcedo, Juin J. Liou, Zhiwei Liu and James E. Vinson, “TCAD methodology for design of SCR devices for Electrostatic Discharge (ESD) applications”, IEEE Transactions on Electron Devices, Vol. 54, No. 4, pp. 822-832, April 2007 Conference Papers: 1. Fan Liu, Wei Huang, Xiaozong Huang, Chenyue Ma, Xinnan Lin and Zhiwei Liu, “Failure analysis of a PLL ESD structure design defect”, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2017), July 2017 2. Xiaozong Huang, Zhiwei Liu, Fan Liu, Jizhi Liu, Wengang Huang, Wenqiang Song, Chenyue Ma and Xinnan Lin, “The segmented SCRs with optimized holding voltage for on-chip ESD protection”, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2017), July 2017 3. Huang Xiaozong, Liu Zhiwei, Liu Fan, Cheng hui and Juin J. Liou, “ESD optimization with on-chip and on-board codesign ESD protection strategy for mixed signal system in package”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 4. Tian Rui, Liu Jizhi, Zhao Liu, Cheng Hui and Liu Zhiwei, “Self-triggered stacked silicon-controlled rectifier structure (STSSCR) for on-chip electrostatic discharge (ESD) protection”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 5. Liu Zhao, Jizhi Liu, Hui Chen, Rui Tian and Zhiwei Liu, “A novel GCSCR structure for ESD protection application”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 6. Liu Fan, Xiang Fan, Xiang Xun, Huang Xiaozong and Liu Zhiwei, “Whole chip ESD protection for 16-channel 16-bit D/A converter”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 7. Hou Fei, Liu Nie, Liu Jizhi and Liu Zhiwei, “A novel dual-SCR ESD protection structure in 0.35-um SiGe BiCMOS process”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 8. Du Feibo, Liu Jizhi, Liu Zhiwei, Qian Lingli and Chen Chen, “A novel dual directional SCR device for advanced nanoscale CMOS process”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 9. Guo Junxiong, Liu Jizhi, Tian Rui, Zhao Liu and Liu Zhiwei, “Novel diode-triggered silicon controlled rectifier (DTSCR) for high temperature low-voltage electrostatic discharge (ESD) application”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 10. Liu Fan, Gao Xingguo, Xiang Xun, Huang Xiaozong and Liu Zhiwei, “Design of radiation-hardened ESD protection for RS485 drivers”, 2016 IEEE International Nonoelectronics Conference (INEC2016), May 2016 11. Guoyan Zhang, Aihua Dong, Nie Liu, Rui Tian, Xuejiao Yang, Zhiwei Liu, Kohui Lee, Horng-Chih Lin, Juin J. Liou and Wang Yuxin, “Failure analysis of Gate-all-around nanowire field effect transistor under TLP test”, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2014), June, 2014 12. Weihuai Wang, Shurong Dong, Lei Zhang, Jie Zeng, Zhihui Yu and Zhiwei Liu, “GGNMOS as ESD protection in different nanometer CMOS process”, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2014), June, 2014 13. Ze Jia, Jizhi Liu, Zihao Tao, Zhiwei Liu, Juin J. Liou, Haiyang Liu, Wei Yang, Junfeng Zhao, “High-speed and low-power FRAM with a bitline-segmental array”, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2014), June, 2014 14. Ze Jia, Jizhi Liu, Zhiwei Liu, Juin J. Liou, Haiyang Liu, Wei Yang and Junfeng Zhao, “A reliability-boosted ferroelectric random access memory with random-dynamic reference cells”, 2014 IEEE 6th International Memory Workshop (IMW 2014), May 2014 15. Zhiwei Liu, Aihua Dong, Zhuoyu Ji, Long Wang, Linfeng He, Wei Liang, Jiabin Miao and Juin J. Liou, “Evaluation of electrostatic discharge (ESD) characteristics for bottom contact organic thin film transistor”, 2013 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2013), May, 2013 16. Zhiwei Liu, Jin He, Juin J. Liou, Jizhi Liu, Meng Miao and Shurong Dong, “Segmented SCR for high voltage ESD protection”, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2012), Nov. 2012 17. Juin J. Liou, Javier A. Salcedo and Zhiwei Liu, “Robust ESD protection solutions in CMOS/BiCMOS technologies”, 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST 2007), 2007 18. Javier A. Salcedo, Zhiwei Liu, Juin J. Liou and James E. Vinson, “Computer-aided design methodology for Electrostatic discharge (ESD) protection applications”, 2006 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS 2006), 2006 Invited Talks: 1. Zhiwei Liu, “SCR device with embedded RC triggering structure for ESD protection”,2017 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2017), Oct. 2017 (without paper publication) 2. Zhiwei Liu, “High holding voltage SCR devices design for high voltage ESD protection”, 2014 International Electron Devices and Materials Symposium (IEDMs 2014), Nov. 2014 (without paper publiation) 3. Zhiwei Liu, Aihua Dong, Zhuoyu Ji, Long Wang, Linfeng He, Wei Liang, Jiabin Miao and Juin J. Liou, “Evaluation of electrostatic discharge (ESD) characteristics for bottom contact organic thin film transistor”, 2013 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC2013), May, 2013 4. Zhiwei Liu, Jin He, Juin J. Liou, Jizhi Liu, Meng Miao and Shurong Dong, “Segmented SCR for high voltage ESD protection”, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2012), Nov. 2012 Edited Books: 1. Ting Li and Ziv Liu, “Outlook and challenges of Nano Devices, Sensors, and MEMS”, Springer, 2017 U.S. Patent: Zhiwei Liu, J.J. Liou and Jim Vinson, “Silicon-controlled rectifier (SCR) for high-voltage Electrostatic Discharge (ESD) applications”, 2010, No.7842971